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Issue DateTitleAuthor(s)
12022X-ray diffraction with micrometre spatial resolution for highly absorbing samplesChakrabarti, Prerana ; Wildeis, Anna ; Hartmann, Markus ; Brandt, Robert ; Modregger, Peter 
22021Nanomechanics: Mechanical response analysis of semiconductor GaAs nanowires by using finite element method and x-ray diffraction techniquesAnjum, Taseer