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    PATTERN RECOGNITION OF ROUGH SURFACES BY USING GONIOMETRIC SCATTERED LIGHT
    Nowadays, most techniques for evaluating rough metal surfaces are based on tactile or confocal measurement procedures.However, these technologies have disadvantages in respect to measuring speeds, resistance to vibration, impact and dust.In this paper we present a novel surface measurement approach, which uses the scattering light technology.Our approach enhances the state-of-the-art scattering light-based surface measurement methodology in both the detector setup and evaluation of the raw intensity values acquired by the scattered light device.The main goal in optimizing the measurement setup is to capture scattering parameters for rough surfaces in a range greater than 10 µm based on an enlarged detector array.Regarding the evaluation, we propose a pattern recognition approach which maps the reflection intensity I back to material structures and the tenpoint mean roughness Rz, the golden standard in tactile roughness characterization.Based on this approach, we are able to classify rough surface deviations like stripes using a simple but robust thresholding.In order to demonstrate the generality of our approach, we evaluate our approach using two rather different materials, i.e. brushed stainless steel and anodized aluminium.
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    PublicationAccess status: Open Access ,
    Pulse based Time-of-Flight range sensing
    Pulse-based Time-of-Flight (PB-ToF) cameras are an attractive alternative range imaging approach, compared to the widely commercialized Amplitude Modulated Continuous-Wave Time-of-Flight (AMCW-ToF) approach. This paper presents an in-depth evaluation of a PB-ToF camera prototype based on the Hamamatsu area sensor S11963-01CR. We evaluate different ToF-related effects, i.e., temperature drift, systematic error, depth inhomogeneity, multi-path effects, and motion artefacts. Furthermore, we evaluate the systematic error of the system in more detail, and introduce novel concepts to improve the quality of range measurements by modifying the mode of operation of the PB-ToF camera. Finally, we describe the means of measuring the gate response of the PB-ToF sensor and using this information for PB-ToF sensor simulation
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      553  371