Citation Link: https://doi.org/10.25819/ubsi/10327
X-ray diffraction with micrometre spatial resolution for highly absorbing samples
Source Type
Article
Institute
Subjects
X-ray diffraction
High spatial resolution
High photon energy
X-ray fluorescence
Goniometers
DDC
530 Physik
Source
Journal of synchrotron radiation ; 29, S. 1407–1413. - https://doi.org/10.1107/S1600577522008025
Issue Date
2022
Abstract
X-ray diffraction with high spatial resolution is commonly used to characterize (poly)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilization of low photon energies. Here, a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometre spatial resolution with a photon energy of 35 keV and above is reported. A highly focused beam was achieved by using compound refractive lenses, and high-precision sample manipulation was enabled by a goniometer that allows up to 5D scans (three rotations and two translations). As experimental examples, the determination of local strain variations in martensitic steel samples with micrometre spatial resolution, as well as the simultaneous elemental distribution for high-Z materials in a thin-film solar cell, are demonstrated. The proposed approach allows users from the materialsscience community to determine micro-structural properties even in highly absorbing samples.
Description
Finanziert im Rahmen der DEAL-Verträge durch die Universitätsbibliothek Siegen
File(s)![Thumbnail Image]()
Loading...
Name
X-ray_diffraction_with_micrometre_spatial_resolution.pdf
Size
1.51 MB
Format
Adobe PDF
Checksum
(MD5):7b8ef5c0e77a51b47348297687c9c458
Owning collection