Reconstruction of surface morphology from coherent scattering of "white" synchrotron radiation in hard x-ray regime

The present third generation synchrotron sources provide intense x-ray radiation in hard x-ray regime to perform coherent x-ray scattering experiments. In 90´s several attempts have been made in performing speckle experiments with x-ray radiation at various surfaces which can provide sub-nm spatial resolution. However, the method is not well established as a routine characterization technique. Several details of the experimental technique and data analysis are not solved.
In this work I measured the coherent reflectivity data from various surfaces at EDR (Energy Dispersive Reflectometry) beamline at the bending magnet of BESSY II synchrotron. White x-rays in the useful energy range of 5